The transmission electron microscope (TEM) used for both planar and cross sectional analysis as well as transmissive electron diffraction is a Zeiss 10C (Fig. B.6) with 4 Å resolution. A high accelerating voltage of 100 KeV is attainable. Exposed micrographs are developed onsite in an automated dark room nitrogen burst tank. The author built the dark room and assembled the nitrogen burst system used in this study. Developed negatives are also permitted onsite. Select prints are digitally scanned for analysis.